Description
Features:
Uncompromised High Performance
Park AFM provides accurate measurement at the highest nanoscale resolution than any other products in its class. It allows you to obtain sample images and its characteristic measurements true to its nano structure thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure based scans. Furthermore, Park’s unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution.
For Current and Future Needs
Park AFM empowers you to innovate now and in the future. It gives you ready access to the largest number of measurement modes in the industry. You can employ any of these modes now, and in the future to support your evolving needs. What’s more, the AFM has the most open access design in the market that allows you to integrate and combine accessories and instruments to tailor it to your unique research requirements.
Easy to Use and High Productivity
Park AFM together with its intuitive graphical user interface, and its automated tools, allows even novice users to get from sample placement to scan results, fast. Starting from pre-aligned tip mount, easy sample and tip exchange, simple laser alignment, on-axis top-down optical viewing, to user friendly scan controls and software processing, the AFM provides the highest research productivity Economical Beyond the System Cost
Not only is Park AFM the most affordable as a research grade, but it is also the most economical in the total cost of ownership. Park’s True Non-Contact™ mode technology found in the AFM allows users to save money on costly probe tips. Moreover, Park AFM offers you much longer product life and upgradeability as a result of its compatibility with the most extensive types of modes and options available in the industry.
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