Park- FX40-Atomic Force Microscope

Effortlessly, get the sharpest, clearest, highest resolution images and measurements one sample after another on various applications. Boost your progress and scientific discoveries through unprecedented speed and accuracy – as the Park FX40 autonomously images and acquires data powered by its artificial intelligence, robotics and machine learning capability. The Additional axis cameras automatically align with laser beams and photodetectors. The early warning systems and fail-safes at every step of the way allow you to focus on your research and not the tool.

Description

Get Smarter with Machine Learning

Park FX40 uses machine learning to automatically detect whether probes are correctly positioned. Smart vision takes it one step further by locating the position of a loaded probe to a nano level and generating error status reports if necessary, instantly comparing this data to tens of thousands of possible simulated issues which are continuously upgraded through software updates.

The True Non-contact mode achieves unprecedented control over tip-sample distance at the sub-nanometer scale. The Park FX40 has a faster and more accurate True Non-contact mode than any other AFM on the market.

Park-System Microscopic Solution